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nikokapo said:[quote author=pullbangdead link=1212512408/12#14 date=1212819454]Also, interferometry can be used to measure the thickness of thin films, without even doing anything else with the light. Doesn't even have to be coherent. Light hits the surface at a non-perpendicular angle: some is reflected at the air-film interface, and some goes through. Then, some light is reflected at the film-substrate interface. Light from both paths then hits the detector, but since the paths were different lengths, the light from the different paths will be out of phase, causing interference. With some more complication and a little math, you can calculate the difference in path lengths, and therefore the film thickness.
This is also exactly what you do with x-ray diffraction, kind of. Except it's x-rays, and the x-rays reflect off of different planes of atoms in the material, giving you the interatomic (or "d") spacing in a material. Bragg's law is basically derived straight from the picture I described above.
So they use x-rays to determine the difference/distance from something to something else?[/quote]
You can do a lot of things with x-ray diffraction, but one of them often used is to find the distance between neighboring planes of atoms in a material.